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/Read Operations With Offset For Slow Charge Loss
Abstract

Apparatuses and methods for performing read operations using an offset based upon slow charge loss characteristics are provided. One example apparatus can include a controller configured to apply a read voltage to a word line in the array of memory cells during a read operation on the word line, wherein the read voltage includes an offset associated with a slow charge loss characteristic of the word line.

Full Text

What is claimed is:

Apparatuses and methods for performing read operations using an offset based upon slow charge loss characteristics are provided. One example apparatus can include a controller configured to apply a read voltage to a word line in the array of memory cells during a read operation on the word line, wherein the read voltage includes an offset associated with a slow charge loss characteristic of the word line.
Timeline
Filed
03/12/2026
Published
07/16/2026
Granted
Not Available
IPC Codes(3)
G11C 16/34:Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
G11C 16/04:using variable threshold transistors, e.g. FAMOS
G11C 16/26:Sensing or reading circuits; Data output circuits