/Method For Processing Substrate And Apparatus For Processing Substrate
Abstract

A method of processing a substrate includes: substituting a functional group with a hydroxyl group by heating a substrate on which a SiN film containing a silicon compound having the functional group composed of nitrogen and hydrogen is formed while supplying a first processing gas containing at least one of H2O2 or H2O to the substrate; and subsequently obtaining a SiO film by heating the substrate to desorb the hydrogen from the silicon compound while supplying, in a plasma state, a second processing gas including at least one of O2 or O3 to the substrate.

Full Text

What is claimed is:

A method of processing a substrate includes: substituting a functional group with a hydroxyl group by heating a substrate on which a SiN film containing a silicon compound having the functional group composed of nitrogen and hydrogen is formed while supplying a first processing gas containing at least one of H2O2 or H2O to the substrate; and subsequently obtaining a SiO film by heating the substrate to desorb the hydrogen from the silicon compound while supplying, in a plasma state, a second processing gas including at least one of O2 or O3 to the substrate.
Timeline
Filed
03/26/2026
Published
07/30/2026
Granted
Not Available
IPC Codes(5)
H10P 14/692:composed of oxides, glassy oxides or oxide-based glasses
C23C 16/455:characterised by the method used for introducing gases into the reaction chamber or for modifying gas flows in the reaction chamber
C23C 16/52:Controlling or regulating the coating process