/Marking Method And Marked Receptacle
Abstract

A marked receptacle and method for marking the receptacle while it is moved along a conveying path wherein the method includes: moving the receptacle in a marking station along the conveying path; simultaneously marking a first surface region and a second surface region of the receptacle while it is moved in the marking station along the conveying path, and using a first laser beam and a second laser beam emitted in opposite directions on sides of the receptacle transversally to the conveying direction; wherein the first and second surface regions are arranged at about 180° from each other with respect to a main axis of the receptacle.

Full Text

What is claimed is:

A marked receptacle and method for marking the receptacle while it is moved along a conveying path wherein the method includes: moving the receptacle in a marking station along the conveying path; simultaneously marking a first surface region and a second surface region of the receptacle while it is moved in the marking station along the conveying path, and using a first laser beam and a second laser beam emitted in opposite directions on sides of the receptacle transversally to the conveying direction; wherein the first and second surface regions are arranged at about 180° from each other with respect to a main axis of the receptacle.
Timeline
Filed
04/22/2026
Published
08/20/2026
Granted
Not Available
IPC Codes(6)
B41J 3/407:for marking on special material
B41J 2/44:using single radiation source, e.g. lighting beams or shutter arrangements (takes precedence B41J 2/475)
B41J 2/45:using light-emitting diode arrays