/Integrated Chip Including Through-substrate Via (tsv) And Landing Structure
Abstract

An integrated chip including a semiconductor substrate having a first side and a second side, opposite the first side. A first transistor and a second transistor are along the first side of the semiconductor substrate. A dielectric structure including a plurality of dielectric layers is under the first side of the semiconductor substrate. A first metal line is within the dielectric structure. A second metal line is within the dielectric structure and under the first metal line. A first metal via extends between the first metal line and the second metal line. A through-substrate via (TSV) extends from the second side of the semiconductor substrate, through the semiconductor substrate between the first transistor and the second transistor, to the first metal line and the second metal line.

Full Text

What is claimed is:

An integrated chip including a semiconductor substrate having a first side and a second side, opposite the first side. A first transistor and a second transistor are along the first side of the semiconductor substrate. A dielectric structure including a plurality of dielectric layers is under the first side of the semiconductor substrate. A first metal line is within the dielectric structure. A second metal line is within the dielectric structure and under the first metal line. A first metal via extends between the first metal line and the second metal line. A through-substrate via (TSV) extends from the second side of the semiconductor substrate, through the semiconductor substrate between the first transistor and the second transistor, to the first metal line and the second metal line.
Timeline
Filed
04/16/2026
Published
08/20/2026
Granted
Not Available
IPC Codes(6)
H10W 20/42:Vias, e.g. via plugs
H10W 20/20:Interconnections within wafers or substrates, e.g. through-silicon vias [TSV]
H10W 42/00:Arrangements for protection of devices (arrangements for thermal protection H10W 40/00)