Abstract
A semiconductor device 400X includes an input terminal 411a, a threshold voltage generation circuit 411d, and at least one comparison circuit 411e. The threshold voltage generation circuit 411d is configured to generate at least one threshold voltage Vthx1 to VthxN containing a fluctuating component depending on a supply voltage VCC1. The comparison circuit 411e is configured to compare an input signal AIN with the threshold voltage Vthx1 to VthxN to generate a comparison signal S1 to SN based on the result of the comparison.
Full Text
What is claimed is:
A semiconductor device 400X includes an input terminal 411a, a threshold voltage generation circuit 411d, and at least one comparison circuit 411e. The threshold voltage generation circuit 411d is configured to generate at least one threshold voltage Vthx1 to VthxN containing a fluctuating component depending on a supply voltage VCC1. The comparison circuit 411e is configured to compare an input signal AIN with the threshold voltage Vthx1 to VthxN to generate a comparison signal S1 to SN based on the result of the comparison.
Timeline
Filed
04/20/2026Published
08/27/2026Granted
Not AvailableIPC Codes(2)
H03K 17/691:using transformer coupling
H03K 17/687:the devices being field-effect transistors