/Three-dimensional Integrated Sensing-memory-computing Chip, Method For Manufacturing The Same, And Computing Method Therefor
Abstract

The present application discloses a three-dimensional integrated sensing-memory-computing chip, a method for manufacturing the same, and a computing method therefor, the chip includes sensing-memory-computing units, each includes a stacked resistive random access-memory device, a sensing device, and a gating device; the stacked resistive random access-memory device group includes at least two resistive random access-memory devices formed in a stack in a thickness direction; the sensing device is configured to receive an external signal and convert the external signal into an input signal, and an output end of the sensing device is coupled to a top electrode of the stacked resistive random access-memory device group; and the gating device is configured to receive a control signal and turned on and turned off based on the control signal, and the gating device is coupled to the top electrode of the stacked resistive random access-memory device group.

Full Text

What is claimed is:

The present application discloses a three-dimensional integrated sensing-memory-computing chip, a method for manufacturing the same, and a computing method therefor, the chip includes sensing-memory-computing units, each includes a stacked resistive random access-memory device, a sensing device, and a gating device; the stacked resistive random access-memory device group includes at least two resistive random access-memory devices formed in a stack in a thickness direction; the sensing device is configured to receive an external signal and convert the external signal into an input signal, and an output end of the sensing device is coupled to a top electrode of the stacked resistive random access-memory device group; and the gating device is configured to receive a control signal and turned on and turned off based on the control signal, and the gating device is coupled to the top electrode of the stacked resistive random access-memory device group.
Timeline
Filed
05/04/2026
Published
09/10/2026
Granted
Not Available
IPC Codes(3)
H10N 70/20:Multistable switching devices, e.g. memristors
H10B 63/00:Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
H10N 70/00:Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching (integrated devices or assemblies of multiple devices H10N 79/00)