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/Analysis Apparatus, Analysis Program, Method, Semiconductor Device, And Semiconductor Wafer
Abstract

An analysis apparatus executes an analysis process for electromagnetic noise performance of a sample. The analysis apparatus is configured to generate a model having a noise performance value of the electromagnetic noise performance of a first sample as a response variable and having multiple product characteristic values of the first sample as explanatory variables. The analysis apparatus is configured to input multiple product characteristic values of a second sample to the explanatory variables of the model, and configured to output data related to analysis of the electromagnetic noise performance of the second sample by using the model. The multiple product characteristic values of the second sample correspond to the multiple product characteristic values of the first sample.

Full Text

What is claimed is:

An analysis apparatus executes an analysis process for electromagnetic noise performance of a sample. The analysis apparatus is configured to generate a model having a noise performance value of the electromagnetic noise performance of a first sample as a response variable and having multiple product characteristic values of the first sample as explanatory variables. The analysis apparatus is configured to input multiple product characteristic values of a second sample to the explanatory variables of the model, and configured to output data related to analysis of the electromagnetic noise performance of the second sample by using the model. The multiple product characteristic values of the second sample correspond to the multiple product characteristic values of the first sample.
Timeline
Filed
05/06/2026
Published
09/10/2026
Granted
Not Available
IPC Codes(3)
G06F 30/398:Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM] (optical proximity correction [OPC] design processes G03F 1/36)
G01R 31/28:Testing of electronic circuits, e.g. by signal tracer (testing computers during standby operation or idle time G06F 11/22)
G06F 119/10:Noise analysis or noise optimisation