A method includes determining a target total bit-error-rate (BER), calculating a target channel BER based on the target total BER, and training a channel to the calculated target channel BER by transmitting data over the channel in a loop from a physical input/output (PHY I/O) to a memory device, transmitting the test data over the channel in the loop from the memory device to the PHY I/O, wherein the data is looped from the memory device and back to the PHY I/O without being written to or road from the memory device, determining an actual channel BER based on the data transmitted to and received from the memory device, comparing the actual channel BER to the calculated target channel BER, and regulating a voltage value based on the comparison.