Abstract
A semiconductor device and method of manufacturing the same are provided. The semiconductor device includes a substrate, a first conductive line, a first conductive via, a second conductive line, and a first barrier layer. The first conductive line is disposed on the substrate. The first conductive via is disposed on the first conductive line. The second conductive line is disposed on the first conductive line. The first barrier layer is disposed between the first conductive via and the second conductive line.
Full Text
What is claimed is:
A semiconductor device and method of manufacturing the same are provided. The semiconductor device includes a substrate, a first conductive line, a first conductive via, a second conductive line, and a first barrier layer. The first conductive line is disposed on the substrate. The first conductive via is disposed on the first conductive line. The second conductive line is disposed on the first conductive line. The first barrier layer is disposed between the first conductive via and the second conductive line.
Timeline
Filed
06/15/2026Published
10/01/2026Granted
Not AvailableIPC Codes(3)
H10W 20/42:Vias, e.g. via plugs
H10W 20/00:Interconnections in chips, wafers or substrates
H10W 20/41:characterised by their conductive parts